X-Ray Fluorescence Spectrometer
The
CAIS maintains a Phillips (Panalytical) PW2420 wavelength-dispersive
XRF spectrometer purchased new in 2002. The instrument
has a total power of 2.4 kW and a 170 position robotic multisampler. A
variety of flow and scintillation detectors, collimators, and
beam filters, coupled with an array of crystals (LIF200; LIF220;
GE111; PE002; and PX1) allow accurate analysis of a wide range
of materials. A sample spinner reduces effects of sample
surface inhomogeneity. The unit can be run in quantitative
(Super Q) or standardless (IQ+) mode, and includes the new generation
of Protrace™ software capable of sub-ppm detection limits. We
can also analyse water samples at ppb levels via the new UltraCarry™ filter
substrate from Rigaku.
XRF Facility :: Analytical Costs :: Sample Submission
For further information contact Dr.
Doug Dvoracek (706) 542-6136
