SCANNING ELECTRON MICROSCOPY

The LEO 982 Field emission scanning electron microscope (FE-SEM, Carl Zeiss SMT Inc. One Corporation Way Peabody, MA 01960) provides a means to achieve ultra high resolution images in the secondary emissive mode. The instrument is an analytical work station since it combines secondary imaging capabilities with backscatter electron imaging useful for discriminating elements by atomic number contrast.
These imaging modes combined with an Oxford (Oxford Instruments, Inc., 130a Baker Ave. Ext., Concord, MA 01742) energy dispersive X-ray analyzer allow for positive identification of elements by spectral analysis, mapping of element distribution, combined with qualitative and quantitative analysis of element concentration. Particle sizing, counting, and chemical typing can be achieved using image processing software on the X-ray analyzer using image processing software on the X-ray analyzer.

Instructions for LEO 982 FE-SEM
Attached to the FE-SEM is the Gatan Alto 2500 Cryostage and cryoprep chamber (Gatan UK, Ferrymills 3, Osney Mead, Oxford, OX2 0ES, UK). With the attached vacuum chamber, the sample can be rapidly frozen in LN slush and transferred to the cryoprep chamber. It is kept frozen and can be fractured, sublimated and coated in the chamber, then moved to the cryostage within the SEM and kept frozen while viewed. Several mounts are available to accomodate a variety of specimens.

Instructions for CryoSEM

View SEM Images
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