TRANSMISSION ELECTRON MICROSCOPY
The FEI Tecnai 20 (FEI Co., Eindhoven, Netherlands) is a 200 kV TEM is the Center's analytical transmission electron microscopy at the Center. Aside from normal viewing of specimens in brightfield, dark field or electron diffraction mode, the Tecnai 20 has scanning transmission capabilities for studying specimen-induced contrast, and an energy dispersive X-ray detector and analyzer for elemental analysis (Oxford). Stereocopic imaging for 3-dimensional viewing of specimens is obtained using the rotatable double tilt specimen holder. A Gatan cryotransfer system allows for imaging frozen hydrated samples.(Gatan Inc., 780 Commonwealth Dr., Warrendale, PA 15086). A Gatan Heater stage is also available.
Click here for a basic Tecnai 20 instruction sheet.
Information about the Tecnai20 as .doc file
A JEOL 100 CX TEM (JEOL USA, Inc., 11 Dearborn Rd., Peabody, MA 01960) complements the Technai 20 and is used for high resolution thin section work, selected area and conversion beam electron diffraction as well as serving as the instructional TEM for the EM program taught at the University.
JEOL TEM instructions.
View TEM Images
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